Advances and problems with TEM characterization of Cr/CrN multilayer coatings.

@article{Morgiel2006AdvancesAP,
  title={Advances and problems with TEM characterization of Cr/CrN multilayer coatings.},
  author={Jerzy Morgiel and L Major and Boguslaw Major and J{\"u}rgen M. Lackner and Laura Nistor},
  journal={Journal of microscopy},
  year={2006},
  volume={223 Pt 3},
  pages={
          237-9
        }
}
Multilayer Cr/CrN/Cr/Cr(N,C) and Cr/CrN with 8 and 32 layer coatings were deposited on austenite substrates using pulsed laser deposition (PLD) technique. The microstructure observations were performed using Philips CM20trade mark, TECNAI G(2) F20 - TWINtrade mark and JEOL EX4000trade mark transmission microscopes. The performed experiments indicated that lowering the argon flow from 60 to 30 cm(3)/s during chromium ablation changes buffer layers microstructure from nearly amorphous to nano… CONTINUE READING
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