Advanced Identification and Quantification of In-Bearing Minerals by Scanning Electron Microscope-Based Image Analysis

@article{Bachmann2017AdvancedIA,
  title={Advanced Identification and Quantification of In-Bearing Minerals by Scanning Electron Microscope-Based Image Analysis},
  author={Kai Bachmann and Max Frenzel and Joachim Krause and Jens Gutzmer},
  journal={Microscopy and Microanalysis},
  year={2017},
  volume={23},
  pages={527 - 537}
}
Abstract The identification and accurate characterization of discrete grains of rare minerals in sulfide base-metal ores is usually a cumbersome procedure due to the small grain sizes (typically <10 μm) and complex mineral assemblages in the material. In this article, a new strategy for finding and identifying indium minerals, and quantifying their composition and abundance is presented, making use of mineral liberation analysis (MLA) and electron probe microanalysis (EPMA). The method was… 
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Indium and selenium distribution in the Neves-Corvo deposit, Iberian Pyrite Belt, Portugal
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