Adaptive multidimensional outlier analysis for analog and mixed signal circuits

@article{Yilmaz2011AdaptiveMO,
  title={Adaptive multidimensional outlier analysis for analog and mixed signal circuits},
  author={Ender Yilmaz and Sule Ozev and Kenneth M. Butler},
  journal={2011 IEEE International Test Conference},
  year={2011},
  pages={1-8}
}
  • Ender Yilmaz, Sule Ozev, Kenneth M. Butler
  • Published in
    IEEE International Test…
    2011
  • Computer Science
  • Outlier devices behave differently from the majority of the devices and are considered to be potentially defective. Identifying outliers has many applications in test, including defect filters for alternate test, and setting pass/fail limits for automotive domain. In previous work, outliers have been identified using single dimensional and/or static methods which does not exploit information efficiently. In this work, we propose an adaptive multidimensional outlier analysis method that combines… CONTINUE READING

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