Adaptive Outlier Detection for Power MOSFETs Based on Gaussian Process Regression

  title={Adaptive Outlier Detection for Power MOSFETs Based on Gaussian Process Regression},
  author={Kyohei Shimozato and Michihiro Shintani and Takashi Sato},
  journal={2022 IEEE Applied Power Electronics Conference and Exposition (APEC)},
Outlier detection of semiconductor devices is important since manufacturing variation is inherently inevitable. In order to properly detect outliers, it is necessary to consider the discrepancy from underlying trend. Conventional methods are insufficient as they cannot track spatial changes of the trend. This study proposes an adaptive outlier detection using Gaussian process regression (GPR) with Student-t likelihood, which captures a gradual spatial change of characteristic variation… 

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