Adaptive Diagnostic Pattern Generation for Scan Chains


Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, a SAT-based technique is proposed to adaptively generate patterns to diagnose stuck-at faults in scan chains. Experimental results on ISCAS'89 benchmark circuits show that the proposed method can dramatically reduce the number of diagnostic patterns while obtain high diagnosis resolution.

DOI: 10.1109/DELTA.2008.45

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@article{Wang2008AdaptiveDP, title={Adaptive Diagnostic Pattern Generation for Scan Chains}, author={Fei Wang and Yu Hu and Xiaowei Li}, journal={4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008)}, year={2008}, pages={129-132} }