Accurately Characterizing Hard Nonlinear Behavior of Microwave Components with the Nonlinear Network Measurement System : Introducing ` Nonlinear Scattering Functions '

@inproceedings{Verspecht1998AccuratelyCH,
  title={Accurately Characterizing Hard Nonlinear Behavior of Microwave Components with the Nonlinear Network Measurement System : Introducing ` Nonlinear Scattering Functions '},
  author={Jan Verspecht and Patrick van Esch},
  year={1998}
}
This paper describes an original way of dealing with the measuring and modeling of microw transistor nonlinear behavior. Although generalizations are possible, the method described i particular paper deals with transistor behavior under a large signal one-tone excitation, w arbitrary impedance terminations for the fundamental and the harmonics. First the mathema theory of the “nonlinear scattering functions” is described. Next the measurement set-up an actual extraction of the model parameters… CONTINUE READING
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