Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal

@article{Jin2005AccurateTO,
  title={Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal},
  author={Le Jin and Kumar L. Parthasarathy and Turker Kuyel and Degang Chen and Randall L. Geiger},
  journal={IEEE Transactions on Instrumentation and Measurement},
  year={2005},
  volume={54},
  pages={1188-1199}
}
Linearity testing of analog-to-digital converters (ADCs) can be very challenging because it requires a signal generator substantially more linear than the ADC under test. This paper introduces the stimulus error identification and removal (SEIR) method for accurately testing ADC linearity using signal generators that may be significantly less linear than the device under test. In the SEIR approach, two imprecise nonlinear but functionally related excitations are applied to the ADC input to… CONTINUE READING
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