Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations

  title={Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations},
  author={Zhongjun Yu and Degang Chen and Randall L. Geiger},
  journal={2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)},
Analog to digital converter (ADC) is the world's largest volume mixed-signal circuit. It is also a key building block in nearly all system on chip (SoC) solutions involving analog and mixed-signal functionalities. ADC testing is also crucial for built-in-self-test (BIST) solutions of AMS testing in SoC technology which is identified by the ITRS as one of four most daunting SoC challenges. ADC spectral testing is of critical importance to a large class of integrated circuits and is particularly… CONTINUE READING
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