Accessing Embedded DfT Instruments with IEEE P1687

  title={Accessing Embedded DfT Instruments with IEEE P1687},
  author={Erik Larsson and Farrokh Ghani Zadegan},
  journal={2012 IEEE 21st Asian Test Symposium},
While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non-intrusive and… CONTINUE READING
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