Accelerated testing for cosmic soft-error rate

Abstract

This paper describes tlie experimentai tecliniques wliich have been developed at IBIM to determine the sensitivity of electronic circuits to cosmic rays at sea level. It relates IBM circuit design and modeling, chip manufacture with process variations, and chip testing for SER sensitivity. This vertical integration from design to final test and with… (More)
DOI: 10.1147/rd.401.0051

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