Accelerated Life Test Plans for Repairable Systems With Multiple Independent Risks

@article{Liu2010AcceleratedLT,
  title={Accelerated Life Test Plans for Repairable Systems With Multiple Independent Risks},
  author={Xiao Liu and Long-Ching Tang},
  journal={IEEE Transactions on Reliability},
  year={2010},
  volume={59},
  pages={115-127}
}
This paper proposes a Bayesian approach to planning an accelerated life test (ALT) for repairable systems with multiple s-independent failure modes. A power law process (PLP), that combines both proportional intensity (PI) and acceleration time (AT) approaches, is used for modeling the failure process of repairable systems under ALT. Based on the Bayesian D-optimality, and Ds-optimality, we develop optimal plans for ALT by invoking the general equivalence theorem. We also discuss the… CONTINUE READING
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