Accelerated Fault Simulation and Fault Grading in Combinational Circuits

Abstract

The principles of fault simulation and fault grading are introduced by a general description of the problem. Based upon the well-known concept of restricting fault simulation to the fanout stems and of combining it with a backward traversal inside the fanout-free regions of the circuit, proposals are presented to further accelerate fault simulation and… (More)
DOI: 10.1109/TCAD.1987.1270316

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