Absolute Electroluminescence Imaging Diagnosis of GaAs Thin-Film Solar Cells

Abstract

A spatially resolved absolute electroluminescence (EL) imaging method was utilized to analyze the photovoltaic properties and resistive loss properties of a GaAs thin-film solar cell. The <italic>I&#x2013;V</italic> relation was extrapolated from the absolute EL efficiency measurements in conjunction with the external-quantum-efficiency (EQE) measurements… (More)

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