Aberration measurement in HRTEM: implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns.

@article{Barthel2010AberrationMI,
  title={Aberration measurement in HRTEM: implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns.},
  author={Juri Barthel and Andreas Thust},
  journal={Ultramicroscopy},
  year={2010},
  volume={111 1},
  pages={
          27-46
        }
}
The precise characterisation of the instrumental imaging properties in the form of aberration parameters constitutes an almost universal necessity in quantitative HRTEM, and is underlying most hardware and software techniques established in this field. We focus in this paper on the numerical analysis of individual diffractograms as a first preparatory step for further publications on HRTEM aberration measurement. The extraction of the defocus and the 2-fold astigmatism from a diffractogram is a… CONTINUE READING
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