AUDIT: Stress Testing the Automatic Way

  title={AUDIT: Stress Testing the Automatic Way},
  author={Youngtaek Kim and Lizy Kurian John and Sanjay Pant and Srilatha Manne and Michael J. Schulte and William Lloyd Bircher and Madhu Saravana Sibi Govindan},
  journal={2012 45th Annual IEEE/ACM International Symposium on Microarchitecture},
Sudden variations in current (large di/dt) can lead to significant power supply voltage droops and timing errors in modern microprocessors. Several papers discuss the complexity involved with developing test programs, also known as stress marks, to stress the system. Authors of these papers produced tools and methodologies to generate stress marks automatically using techniques such as integer linear programming or genetic algorithms. However, nearly all of the previous work took place in the… CONTINUE READING
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