ATPG-based grading of strong fault-secureness

@article{Hunger2009ATPGbasedGO,
  title={ATPG-based grading of strong fault-secureness},
  author={Marc Hunger and Sybille Hellebrand and Alexander Czutro and Ilia Polian and Bernd Becker},
  journal={2009 15th IEEE International On-Line Testing Symposium},
  year={2009},
  pages={269-274}
}
Robust circuit design has become a major concern for nanoscale technologies. As a consequence, for design validation, not only the functionality of a circuit has to be considered, but also its robustness properties have to be analyzed. In this work we propose a method to verify the strong fault-secureness by use of constrained SAT-based ATPG. Strongly fault-secure circuits can be seen as the widest class of circuits achieving the totally self-checking (TSC) goal, which requires that every fault… CONTINUE READING

Figures, Tables, and Topics from this paper.

Citations

Publications citing this paper.
SHOWING 1-10 OF 15 CITATIONS

SAT-based ATPG beyond stuck-at fault testing

  • it - Information Technology
  • 2014
VIEW 6 EXCERPTS
CITES BACKGROUND & METHODS
HIGHLY INFLUENCED

A better-than-worst-case robustness measure

  • 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
  • 2010
VIEW 4 EXCERPTS
CITES METHODS & BACKGROUND
HIGHLY INFLUENCED

Synthesis of multiple fault oriented test groups from single fault test sets

  • 2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
  • 2013
VIEW 1 EXCERPT
CITES BACKGROUND

The influence of implementation type on dependability parameters

  • Microprocessors and Microsystems - Embedded Hardware Design
  • 2013
VIEW 1 EXCERPT
CITES BACKGROUND

Complete and effective robustness checking by means of interpolation

  • 2012 Formal Methods in Computer-Aided Design (FMCAD)
  • 2012
VIEW 1 EXCERPT
CITES BACKGROUND

The Influence of Implementation Technology on Dependability Parameters

  • 2012 15th Euromicro Conference on Digital System Design
  • 2012
VIEW 1 EXCERPT
CITES BACKGROUND

Similar Papers

Loading similar papers…