ASIC for SDD-based X-ray spectrometers

@article{Rehak2009ASICFS,
  title={ASIC for SDD-based X-ray spectrometers},
  author={Pavel Rehak and Gianluigi De Geronimo and K. Ackley and G. A. Carini and Wei Chen and Jack Fried and Julie E. Keister and Shaorui Li and Zheng Ying Li and D. A. Pinelli and D. P. Siddons and Emerson Vernon and J. A. Gaskin and B. D. Ramsey and T. A. Tyson},
  journal={2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)},
  year={2009},
  pages={1088-1095}
}
We present an application-specific integrated circuit (ASIC) for high-resolution x-ray spectrometers (XRS). The ASIC reads out signals from pixelated silicon drift detectors (SDDs). The pixel does not have an integrated field effect transistor (FET); rather, readout is accomplished by wire-bonding the anodes to the inputs of the ASIC. The ASIC dissipates 32 mW, and offers 16 channels of low-noise charge amplification, high-order shaping with baseline stabilization, discrimination, a novel pile… CONTINUE READING

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