ADC testing - Part 7 in a series of tutorials in Instrumentation and Measurements

@article{Linnenbrink2006ADCT,
  title={ADC testing - Part 7 in a series of tutorials in Instrumentation and Measurements},
  author={T. E. Linnenbrink and Janice Blair and Sergio Rapuano and Pasquale Daponte and Eulalia Balestrieri and Luca De Vito and Solomon Max and S W Tilden},
  journal={IEEE Instrumentation & Measurement Magazine},
  year={2006},
  volume={9},
  pages={37-47}
}
A nalog-to-digital converters (ADCs) are tested for several reasons. Manufacturers need to measure the ADC’s performance so that they can guarantee to their users what performance to expect of the ADC (usually via a specification sheet) and to assure the quality of the ADCs they produce. Users need to measure the ADC’s performance relative to its specification as well as for its intended use. Both static and dynamic performance parameters may be assessed. It is important for those measuring ADC… CONTINUE READING

Citations

Publications citing this paper.
SHOWING 1-10 OF 15 CITATIONS

Postcorrection of Pipelined Analog–Digital Converters Based on Input-Dependent Integral Nonlinearity Modeling

  • IEEE Transactions on Instrumentation and Measurement
  • 2011
VIEW 4 EXCERPTS
CITES BACKGROUND & METHODS
HIGHLY INFLUENCED

OBT applied to a 2nd order continuous time Feedforward Sigma Delta modulator

  • 2019 IEEE Latin American Test Symposium (LATS)
  • 2019
VIEW 1 EXCERPT
CITES METHODS

Integral Nonlinear Fitting and Calibration of High Precision Analog-Digital Converters

  • 2016 13th International Conference on Embedded Software and Systems (ICESS)
  • 2016
VIEW 1 EXCERPT
CITES METHODS

Input-Dependent Integral Nonlinearity Modeling for Pipelined Analog–Digital Converters

  • IEEE Transactions on Instrumentation and Measurement
  • 2010
VIEW 2 EXCERPTS
CITES METHODS & BACKGROUND

Model order determination and segmentation of analog-digital converters integral non linearity

  • 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings
  • 2010
VIEW 1 EXCERPT
CITES BACKGROUND

Device Verification Testing of High-Speed Analog-to-Digital Converters in Satellite Communication Systems

  • IEEE Transactions on Instrumentation and Measurement
  • 2009
VIEW 2 EXCERPTS
CITES BACKGROUND & METHODS

Similar Papers

Loading similar papers…