ABRM: Adaptive <formula formulatype="inline"><tex Notation="TeX">$ \beta$</tex></formula>-Ratio Modulation for Process-Tolerant Ultradynamic Voltage Scaling

Abstract

Subthreshold operation of digital circuits has emerged as a promising approach to achieve ultralow power dissipation. However, extensive application of subthreshold logic is limited due to low performance and high susceptibility to process variation (PV). This paper proposes a PV-tolerant ultradynamic voltage scaling (UDVS) system where performance… (More)
DOI: 10.1109/TVLSI.2008.2010767

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@article{Hwang2010ABRMA, title={ABRM: Adaptive \$ \beta\$-Ratio Modulation for Process-Tolerant Ultradynamic Voltage Scaling}, author={Myeong-Eun Hwang and Kaushik Roy}, journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems}, year={2010}, volume={18}, pages={281-290} }