A versatile high speed bit error rate testing scheme

@article{Fan2004AVH,
  title={A versatile high speed bit error rate testing scheme},
  author={Yongquan Fan and Zeljko Zilic and Man Wah Chiang},
  journal={International Symposium on Signals, Circuits and Systems. Proceedings, SCS 2003. (Cat. No.03EX720)},
  year={2004},
  pages={395-400}
}
The quality of a digital communication interface can be characterized by its bit error rate (BER) performance. To ensure the quality of the manufactured interface, it is critical to quickly and precisely test its BER behavior. Traditionally, BER is evaluated using software simulations, which are very time-consuming. Though there are some standalone BER test… CONTINUE READING