A transmission x-ray microscope based on secondary-electron imaging

@inproceedings{Watts1997ATX,
  title={A transmission x-ray microscope based on secondary-electron imaging},
  author={Roland Watts and Stanley D. Liang and Zachary H. Levine and Thomas B. Lucatorto and Francois A. Polack and Michael R. Scheinfein},
  year={1997}
}
A design for a transmission x-ray microscope with 20 nm transverse spatial resolution is presented. The microscope, which is based on the electron-optical imaging of the photoemitted electrons from an x-ray shadowgraph, consists of a transmission x-ray photocathode coupled to a photoelectron emission microscope (PEEM—also called a PEM for photoelectron microscope). Unlike the conventional PEEM, which produces a surface map of photoelectron yield, this microscope can provide information on the… CONTINUE READING