A test of the lucky-drift theory of the impact ionisation coefficient using Monte Carlo simulation

@inproceedings{McKenzie1986ATO,
  title={A test of the lucky-drift theory of the impact ionisation coefficient using Monte Carlo simulation},
  author={Sati McKenzie and M. W. G. Burt},
  year={1986}
}
A new formulation, due to Burt (1985), of the lucky-drift theory of the impact ionisation coefficient is tested against a Monte Carlo simulation for a model semiconductor. The model is especially tailored to ensure that the electrons have an energy-independent mean free path against the emission or absorption of a phonon. Lucky-drift theory is used to derive simple analytic expressions for the steady-state drift velocity, the steady-state average energy and the impact ionisation coefficient… CONTINUE READING

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