A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth

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@inproceedings{Li2016ASX, title={A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth}, author={C. Li and Simon D. M. Jacques and Y. Chen and Dominik Daisenberger and Ping Xiao and Nicolaie Markocsan and Pamela Nylen and Robert J. Cernik}, booktitle={Journal of applied crystallography}, year={2016} }