A study on the evaluation method of glass frit paste for crystalline silicon solar cells

Abstract

Conductive paste degrades the solar cell performance due to the metallization. Silver crystallites at the interface may shunt the p-n junction, which degrades the cell performance. Besides, it is conceivable that glass frit itself should not effectively damage silicon, but there is no clear evidence for the proof. In this study, the “floating contact… (More)

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Cite this paper

@article{Aoki2016ASO, title={A study on the evaluation method of glass frit paste for crystalline silicon solar cells}, author={Mari Aoki and Takayuki Aoyama and Isao Sumita and Yasushi Yoshino and Atsushi Ogura and Yoshio Ohshita}, journal={2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)}, year={2016}, pages={2850-2853} }