A study on an approach for analysing test basis using I/O test data patterns

Abstract

For software testing, it is important to derive test cases without lacking or duplication before test execution. Test basis to be analysed in test development process for black box testing is a functional specification. And it is less analysed under consistency rules. As a result, this has the potential to cause the lacking or duplication of test cases. This paper proposes an approach for analysing test basis focusing on data I/O in test execution to achieve analysing test basis can be more comprehensive. Moreover, in order to demonstrate this approach, an experiment is performed comparing with test cases in a real project.

DOI: 10.1109/ICSTW.2015.7107429

Cite this paper

@article{Yumoto2015ASO, title={A study on an approach for analysing test basis using I/O test data patterns}, author={Tsuyoshi Yumoto and Tohru Matsuodani and Kazuhiko Tsuda}, journal={2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)}, year={2015}, pages={1-8} }