A soft error rate analysis (SERA) methodology

@inproceedings{Zhang2004ASE,
  title={A soft error rate analysis (SERA) methodology},
  author={Ming Zhang and Naresh R. Shanbhag},
  booktitle={ICCAD 2004},
  year={2004}
}
We present a soft error rate analysis (SERA) methodology for combinational and memory circuits. SERA is based on a modeling and analysis-based approach that employs a judicious mix of probability theory, circuit simulation, graph theory and fault simulation. SERA achieves five orders of magnitude speed-up over Monte Carlo based simulation approaches with less than 5% error. Dependence of soft error rate (SER) of combinational circuits on supply voltage, clock period, latching window, circuit… CONTINUE READING

Citations

Publications citing this paper.
SHOWING 1-10 OF 119 CITATIONS

Identification of Soft-Error at Gate Level

VIEW 4 EXCERPTS
CITES BACKGROUND & METHODS
HIGHLY INFLUENCED

An Improved Soft-Error Rate Measurement Technique

  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • 2009
VIEW 3 EXCERPTS
CITES METHODS
HIGHLY INFLUENCED

Signature-Based SER Analysis and Design of Logic Circuits

  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • 2009
VIEW 6 EXCERPTS
CITES METHODS & BACKGROUND
HIGHLY INFLUENCED

The Effect of Re-Convergence on SER Estimation in Combinational Circuits

  • IEEE Transactions on Nuclear Science
  • 2009
VIEW 5 EXCERPTS
CITES BACKGROUND & METHODS
HIGHLY INFLUENCED

On the role of timing masking in reliable logic circuit design

  • 2008 45th ACM/IEEE Design Automation Conference
  • 2008
VIEW 5 EXCERPTS
CITES BACKGROUND & METHODS
HIGHLY INFLUENCED

Soft Error Mitigation Through Selective Addition of Functionally Redundant Wires

  • IEEE Transactions on Reliability
  • 2008
VIEW 3 EXCERPTS
CITES BACKGROUND & METHODS
HIGHLY INFLUENCED

Computing the Soft Error Rate of a Combinational Logic Circuit Using Parameterized Descriptors

  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • 2007
VIEW 7 EXCERPTS
CITES RESULTS, BACKGROUND & METHODS
HIGHLY INFLUENCED

A stimulus-free probabilistic model for single-event-upset sensitivity

  • 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06)
  • 2006
VIEW 4 EXCERPTS
CITES METHODS & BACKGROUND
HIGHLY INFLUENCED

An Efficient Static Algorithm for Computing the Soft Error Rates of Combinational Circuits

  • Proceedings of the Design Automation & Test in Europe Conference
  • 2006
VIEW 6 EXCERPTS
CITES METHODS, BACKGROUND & RESULTS
HIGHLY INFLUENCED

Circuit Reliability Analysis Using Symbolic Techniques

  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • 2006
VIEW 8 EXCERPTS
CITES BACKGROUND, METHODS & RESULTS
HIGHLY INFLUENCED

FILTER CITATIONS BY YEAR

2005
2019

CITATION STATISTICS

  • 32 Highly Influenced Citations