A simplified computer analysis for n-well guard ring efficiency in CMOS circuits

@inproceedings{Chen1987ASC,
  title={A simplified computer analysis for n-well guard ring efficiency in CMOS circuits},
  author={Ming-Jer Chen and Ching-Yuan Wu},
  year={1987}
}
Abstract Based on solving the 2-D continuity and current transport equations for electrons injected into the substrate of a n -well CMOS, a quantitative evaluation of n -well guard ring efficiency in terms of the escape electron current is presented. Simulation results show that in the worst-case condition Auger recombination inherent in the heavily-doped substrate of epi-CMOS is responsible for the enhancement of n -well guard ring efficiency. Also, our simulations show that the substrate… CONTINUE READING