A sigma-delta modulation based BIST scheme for mixed-signal circuits

Abstract

In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for mixed-signal circuits.

DOI: 10.1145/368434.368830

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Cite this paper

@inproceedings{Huang2000ASM, title={A sigma-delta modulation based BIST scheme for mixed-signal circuits}, author={Jiun-Lang Huang and Kwang-Ting Cheng}, booktitle={ASP-DAC}, year={2000} }