A semi-empirical approach to determine the effective minimum current pulse width (T) for an operating silicon chip

@article{Bhattacharyya2007ASA,
  title={A semi-empirical approach to determine the effective minimum current pulse width (T) for an operating silicon chip},
  author={B. Bhattacharyya and Amit Levin and Gang Huo},
  journal={2007 International Power Engineering Conference (IPEC 2007)},
  year={2007},
  pages={922-927}
}
In this paper we are going to discuss a semi-empirical approach, which will allow us, to determine the effective minimum time interval (T), over which voltage noise affects the performance of a silicon integrated circuit. This interval corresponds to simultaneous voltage collapse of the power delivery network, and current demand from the silicon. The current amplitude I0 in this paper is assumed to be an average current drawn by the device when measured close to the power supply or close to the… CONTINUE READING