A scanning probe study of some short chain self-assembled alkylsilane films

Abstract

Trichloroalkylsilanes readily form self-assembled monolayers (SAMs) on mica surfaces. The present work uses scanning probe methods (atomic force microscopy (AFM), chemical force microscopy (CFM) and nanoindentation) to study aspects of the assembly process and the properties of some short chain forms of these self-assembled monolayers. The deposition of… (More)

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