A scan chain optimization method for diagnosis

Abstract

Scan chain structure consumes 10%~30% of die area, and most yield loss is caused by scan chain faults. This makes scan chain diagnosis be the key important method to ensure the high-quality products. The conventional scan chain diagnosis techniques usually conduct to a large range of suspect faulty flip flops. The failure analysis of those suspect faulty… (More)
DOI: 10.1109/ICCD.2015.7357172

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