A robust smart power bandgap reference circuit for use in an automotive environment

  title={A robust smart power bandgap reference circuit for use in an automotive environment},
  author={W. Horn and H. Zitta},
  journal={Proceedings of the 27th European Solid-State Circuits Conference},
  • W. Horn, H. Zitta
  • Published 2001 in
    Proceedings of the 27th European Solid-State…
In the development of smart power products for automotive applications, robustness to all kinds of disturbances is one of the key issues. For junction-isolated smart power technologies such as SPT1, negative voltages at the drain terminal of a power DMOS lead to minority carrier injection into the substrate. This can cause malfunction of sensitive circuits such as bandgap references and may subsequently lead to severe functional failures of the device. Furthermore, in smart power ICs very high… CONTINUE READING
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