A process variation insensitive bandgap reference with self-calibration technique

Abstract

A process variation insensitive bandgap reference with self-calibration is presented. The initial accuracy of the bandgap reference is improved with self-calibration. The offset voltage caused by components mismatch due to process variation is averaged with a 6-bit resistor trimming array and the code for trimming is generated by the circuit itself. The 3… (More)
DOI: 10.1109/ASICON.2013.6811901

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Cite this paper

@article{Du2013APV, title={A process variation insensitive bandgap reference with self-calibration technique}, author={Ling Du and Ning Ning and Kejun Wu and Yang Liu and Qi Yu}, journal={2013 IEEE 10th International Conference on ASIC}, year={2013}, pages={1-4} }