A probabilistic approach for failure localization

  title={A probabilistic approach for failure localization},
  author={Tania Panayiotou and Sotirios P. Chatzis and Georgios Ellinas},
  journal={2017 International Conference on Optical Network Design and Modeling (ONDM)},
This work considers the problem of fault localization in transparent optical networks. The aim is to localize single-link failures by utilizing statistical machine learning techniques trained on data that describe the network state upon current and past failure incidents. In particular, a Gaussian Process (GP) classifier is trained on historical data extracted from the examined network, with the goal of modeling and predicting the failure probability of each link therein. To limit the set of… CONTINUE READING

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Gaussian Process: Theory

  • R. A. Davis
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  • 2014
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