A parameter refinement method for Ptychography based on Deep Learning concepts

@article{Guzzi2021APR,
  title={A parameter refinement method for Ptychography based on Deep Learning concepts},
  author={Francesco Guzzi and George Kourousias and Fulvio Bill{\`e} and Roberto Pugliese and Alessandra Gianoncelli and Sergio Carrato},
  journal={ArXiv},
  year={2021},
  volume={abs/2105.08058}
}
X-ray ptychography is an advanced computational microscopy technique, which is delivering exceptionally detailed quantitative imaging of biological and nanotechnology specimens, which can be used for high-precision X-ray measurements. However, coarse parametrisation in propagation distance, position errors and partial coherence frequently threaten the experimental viability. In this work, we formally introduce these actors, solving the whole reconstruction as an optimisation problem. A modern… 

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