A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection

@article{Chun2010ANC,
  title={A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection},
  author={Ji Hwan Chun and Jae Wook Lee and Jacob A. Abraham},
  journal={2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)},
  year={2010},
  pages={312-317}
}
Timing problems in high-speed serial communications are mitigated with phase-interpolator (PI) circuitry. Linearity testing of PI has been challenging, even though PI is widely used in modern high speed I/O architectures. Previous research has focused on implementing additional built-in circuits to measure PI linearity. In this paper, we present a cost effective PI linearity measurement technique which requires no significant modification of existing I/O circuits. Our method uses jitter… CONTINUE READING