A new quality estimation methodology for mixed-signal and analogue ICs

Abstract

IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a quality estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the quality related parameters… (More)
DOI: 10.1109/EDTC.1997.582419

7 Figures and Tables

Topics

  • Presentations referencing similar topics