A new model for electromigration grain boundary noise based on free volume

@inproceedings{2010ANM,
  title={A new model for electromigration grain boundary noise based on free volume},
  author={何亮 and 杜磊 and 庄奕琪 and 陈华 and 陈文豪 and 李伟华 and 孙鹏},
  year={2010}
}
Grain boundary plays a key role in electromigration process of polycrystal interconnection. We take a free volume to represent a 'vacancy–ion complex' as a function of grain boundary specific resistivity, and develop a new characterisation model for grain boundary noise. This model reveals the internal relation between the boundary scattering section and electromigration noise. Comparing the simulation result with our experimental result, we find the source as well as the form of noise change… CONTINUE READING