A new line symmetry distance based pattern classifier

@article{Saha2008ANL,
  title={A new line symmetry distance based pattern classifier},
  author={Sriparna Saha and Sanghamitra Bandyopadhyay and Chingtham Tejbanta Singh},
  journal={2008 IEEE International Joint Conference on Neural Networks (IEEE World Congress on Computational Intelligence)},
  year={2008},
  pages={1425-1432}
}
In this paper, a new line symmetry based classifier (LSC) is proposed to deal with pattern classification problems. In order to measure total amount of line symmetry of a particular point in a class, a new definition of line symmetry based distance is also proposed in this paper. The proposed line symmetry based classifier (LSC) utilizes this new definition of line symmetry distance for classifying an unknown test sample. LSC assigns an unknown test sample pattern to that class with respect to… CONTINUE READING