A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design.

@article{Tromp2010ANA,
  title={A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design.},
  author={Rudolf M. Tromp and James B. Hannon and Aja Ellis and Wei Wan and A. Berghaus and O. Schaff},
  journal={Ultramicroscopy},
  year={2010},
  volume={110 7},
  pages={852-61}
}
We describe a new design for an aberration-corrected low energy electron microscope (LEEM) and photo electron emission microscope (PEEM), equipped with an in-line electron energy filter. The chromatic and spherical aberrations of the objective lens are corrected with an electrostatic electron mirror that provides independent control over the chromatic and spherical aberration coefficients C(c) and C(3), as well as the mirror focal length, to match and correct the aberrations of the objective… CONTINUE READING

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