• Corpus ID: 246063725

A nanomechanical testing framework yielding front&rear-sided, high-resolution, microstructure-correlated SEM-DIC strain fields

  title={A nanomechanical testing framework yielding front\&rear-sided, high-resolution, microstructure-correlated SEM-DIC strain fields},
  author={Tijmen Vermeij and Jorn Verstijnen and Tim Ramirez y Cantador and Beno{\^i}t Blaysat and Jan Neggers and J. P. M. Hoefnagels},
The continuous development of new multiphase alloys with improved mechanical properties requires quantitative microstructure-resolved observation of the nanoscale deformation mechanisms at, e.g., multiphase interfaces. This calls for a combinatory approach beyond advanced testing methods such as microscale strain mapping on bulk material and micrometer sized deformation tests of single grains. We propose a nanomechanical testing framework that has been carefully designed to integrate several… 
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