A nanomechanical testing framework yielding front&rear-sided, high-resolution, microstructure-correlated SEM-DIC strain fields
@inproceedings{Vermeij2022ANT, title={A nanomechanical testing framework yielding front\&rear-sided, high-resolution, microstructure-correlated SEM-DIC strain fields}, author={Tijmen Vermeij and Jorn Verstijnen and Tim Ramirez y Cantador and Beno{\^i}t Blaysat and Jan Neggers and J. P. M. Hoefnagels}, year={2022} }
The continuous development of new multiphase alloys with improved mechanical properties requires quantitative microstructure-resolved observation of the nanoscale deformation mechanisms at, e.g., multiphase interfaces. This calls for a combinatory approach beyond advanced testing methods such as microscale strain mapping on bulk material and micrometer sized deformation tests of single grains. We propose a nanomechanical testing framework that has been carefully designed to integrate several…
One Citation
Crystallographic slip activity fields identified automatically from DIC data, even for intersecting, diffuse and cross slip
- Materials Science
- 2022
Crystallographic slip system identification methods are widely employed to characterize the fine scale deformation of metals. While powerful and widely employed, they usually rely on the occurrence of…
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