A modular wrapper enabling high speed BIST and repair for small wide memories

@article{Aitken2004AMW,
  title={A modular wrapper enabling high speed BIST and repair for small wide memories},
  author={Robert C. Aitken},
  journal={2004 International Conferce on Test},
  year={2004},
  pages={997-1005}
}
This work describes a modular design of a wrapper enabling BIST/BISR for small memories operating as register files or FIFOs in high speed applications such as graphics and networking. The wrapper allows for at-speed test at low overhead and enables a simple repair scheme when millions of bits are used in such memories. The wrapper is intended to provide a standardized interface between memory and test controller, and thus work with any BIST controller, and communication between the two is… CONTINUE READING
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