A method for determining the spring constant of cantilevers for atomic force microscopy

@inproceedings{Torii1996AMF,
  title={A method for determining the spring constant of cantilevers for atomic force microscopy},
  author={Akihiro Torii and Minoru Sasaki and Kazuhiro Hane and Shigeru Okuma},
  year={1996}
}
Cantilevers fabricated by means of micromachining techniques are usually used for atomic force microscopy. In this paper, the spring constant of an atomic force microscope (AFM) cantilever is determined by using a large-scale cantilever. Since the spring constant of the large-scale cantilever is calibrated accurately, the spring constant of the AFM… CONTINUE READING