A hierarchical self test scheme for SoCs

Abstract

Complex systems on a chip (SoCs) suffer from a couple of test related problems. In almost any case they contain processor devices and complex on-chip networks that need to be tested under heavily restricted access from the outside. Today multi-processor SoCs (MP-SoCs) are becoming the rule rather than the exception and many SoCs consist of heterogeneous… (More)
DOI: 10.1109/IOLTS.2004.3

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Cite this paper

@article{Kretzschmar2004AHS, title={A hierarchical self test scheme for SoCs}, author={Claudia Kretzschmar and Christian Galke and Heinrich Theodor Vierhaus}, journal={Proceedings. 10th IEEE International On-Line Testing Symposium}, year={2004}, pages={37-42} }