A fine-grained technique of NBTI-aware voltage scaling and body biasing for standard cell based designs

Abstract

As the technology scales, the increase of circuit delay over time due to NBTI (negative bias temperature instability) effect is not negligible any more. It has been known that voltage scaling is an effective scheme that is able to mitigate the NBTI effect. However, a careful control of voltage scaling is required not to increase the dissipation of dynamic… (More)

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Cite this paper

@article{Lee2011AFT, title={A fine-grained technique of NBTI-aware voltage scaling and body biasing for standard cell based designs}, author={Yongho Lee and Taewhan Kim}, journal={16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)}, year={2011}, pages={603-608} }