A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation

@article{Yamato2012AFA,
  title={A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation},
  author={Yuta Yamato and Tomokazu Yoneda and Kazumi Hatayama and Michiko Inoue},
  journal={2012 IEEE International Test Conference},
  year={2012},
  pages={1-8}
}
In return for increased operating frequency and reduced supply voltage in nano-scale designs, their vulnerability to IR-drop-induced yield loss grew increasingly apparent. Therefore, it is necessary to consider delay increase effect due to IR-drop during at-speed scan testing. However, it consumes significant amounts of time for precise IR-drop analysis. This paper addresses this issue with a novel per-cell dynamic IR-drop estimation method. Instead of performing time-consuming IR-drop analysis… CONTINUE READING
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