A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns.

@article{Xu2017ADC,
  title={A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns.},
  author={W. Xu and J M Lebeau},
  journal={Ultramicroscopy},
  year={2017},
  volume={188},
  pages={
          59-69
        }
}
  • W. XuJ. Lebeau
  • Published 3 August 2017
  • Computer Science, Physics
  • Ultramicroscopy

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