Corpus ID: 6859635

A current-path based placement methodology for analog IC layout design

  title={A current-path based placement methodology for analog IC layout design},
  author={Zhi-Ming Lin and Mei-Yuan Liao and K. Huang},
In this paper, we present a transistor placement methodology for CMOS analog integrated circuit that leads the subsequent phase to conform to analog layout constraints, such as: matching, symmetry, signal coupling and geometric constraints such as: cell aspect ratio (or cell height), and user-defined cell input/output pin locations. This placement methodology bases on the characteristics of current paths and the layout constraints can help us to obtain better performance, that is guaranteed by… Expand


ILAC: an automated layout tool for analog CMOS circuits
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A constraint based approach to automatic design of analog cells
A new system which automatically sizes and places CMOS analog cells is presented, focusing on general rules and algorithms which suit any type of operational amplifier. Expand
High-performance designs with CMOS analog standard cells
It is shown that through the use of a fixed-height cell system and a predefined connection system, circuits can be designed that suffer little, if any, area penalty when compared to a full custom layout. Expand
OPASYN: a compiler for CMOS operational amplifiers
A silicon compilation system for CMOS operational amplifiers (OPASYN) is discussed, which produces a design-rule-correct compact layout of an optimized operational amplifier. Expand
Statistical Modeling of Device Mismatch MOS Integrated Circuits for Analog
A generalized parameter-level statistical MOS model, called SMOS, capable of generating statistically signif- icant model decks from intra- and inter-die parameters statis- tics is described.Expand
Matching Properities of MOS Transistors Statistical Modeling of Device Mismatching for Analog MOS Integrated Circuits
  • IEEE J . of Solid - State Circuits
  • 1992
Matching Properities of MOS Transistors
  • IEEE J. of Solid-State Circuits, Vol 24, No. 5, 1989, pp. 1433-1440.
  • 1989