A critical assessment of potential measurement biases in the technology acceptance model: three experiments

@article{Davis1996ACA,
  title={A critical assessment of potential measurement biases in the technology acceptance model: three experiments},
  author={Fred D. Davis and Viswanath Venkatesh},
  journal={Int. J. Hum.-Comput. Stud.},
  year={1996},
  volume={45},
  pages={19-45}
}
The Technology Acceptance Model (TAM) is widely used by researchers and practitioners to predict and explain user acceptance of information technologies . TAM models system usage intentions and behavior as a function of perceived usefulness and perceived ease of use . The original scales for measuring the TAM constructs have been confirmed to be reliable and valid in several replications and applications spanning a range of technologies and user populations . However , a measurement bias may be… CONTINUE READING

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