A comprehensive scheme for logic self repair

  title={A comprehensive scheme for logic self repair},
  author={Tobias Koal and Daniel Scheit and Heinrich Theodor Vierhaus},
  journal={Signal Processing Algorithms, Architectures, Arrangements, and Applications SPA 2009},
Predictions for the properties of integrated circuits and systems fabricated in emerging nano-technologies indicate a rising level of static and dynamic faults due to new fault mechanisms. Not only transient faults due to particle radiation are becoming a problem, but also wear-out effects on transistors and interconnects. While transient faults can be… CONTINUE READING